Fig 1

Fig 1

Growth of P. aeruginosa cultures infected with CK4 phages and phenotypic traits of phage-resistant mutants. (A) PAO1 cultures growing in LB at 37°C were infected at m.o.i. = 2.5 with CK4 or CK4− components at time = 0 and the OD₆₀₀ measured at intervals. The red arrow indicates the OD₆₀₀ reached by the cultures at the end of the experiment. The last time point of the growth curves of E215-infected PAO1 overlaps with that of PAO1 infected with DEV, PYO2, and E217. n.i., non-infected. Similar results were obtained in replicate experiments. (B) Growth of CK4, DEV, and E217 on cross-resistant mutants (CRmut) and mutants specifically resistant to E217 (ERmut). Four microliters of phage lysates at ca. 10⁸ pfu/mL were spotted on LB agar plates topped with soft agar inoculated with 0.4 mL of PAO1 or PAO1 mutants’ cultures. (C) Phenotype of ERmut mutants. Patch on LB agar formed by non-pigmented (ERmut-a and CR-mut) and brown-pigmented (ERmut-b) mutants.