Search Ontology:
Evidence Ontology
atomic force microscopy evidence
- Term ID
- ECO:0001589
- Synonyms
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- AFM
- scanning force microscopy
- SFM
- Definition
- A type of microscopy evidence where a mechanical probe is applied to a sample (i.e. a type of scanning probe microscopy) which can result in production of an image (with resolution in the order of fractions of a nanometer), force measurement, or sample manipulation.
- References
- Ontology
- Evidence Ontology
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