ZFIN Image: Ma et al., 2024, Fig. 2

Image

Figure Caption

Fig. 2 Morphology characterization of the nanoprobe.

a SEM image showing (i) the glass nanopipette, (ii) the nanopipette coated with Pt and Ni on both sides, and (iii) the nanoprobe coated with Al₂O₃. b EDS maps of the nanoprobe revealing the presence of Si, O, Ni, Pt, and Al at the nanoprobe tip. c Illustration of the FIB milling and subsequent HIM imaging. The nanoprobe sample was positioned perpendicular to the FIB detector, while the HIM detector was at a 54° angle relative to the FIB detector. d HIM images of the nanoprobe before FIB cutting and (e) after FIB cutting

Acknowledgments

This image is the copyrighted work of the attributed author or publisher, and ZFIN has permission only to display this image to its users. Additional permissions should be obtained from the applicable author or publisher of the image. Full text @ Microsyst Nanoeng